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Micromechanical analysis of residual stress effect in CVD-processed diamond wafer

Authors

Lee, Wook Seong; Jeong, Jeung hyun

Issue Date

1999-01-01

Citation

Materials Research Society, USA, pp.373 - 378

URI

https://pubs.kist.re.kr/handle/201004/84979

Appears in Collections:

KIST Conference Paper > Others

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