DSpace at KIST: TEM Characterization of Highly Oriented Diamond Films on (001) Silicon Synthesized by Bias Enhanced Nucleation Technique

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TEM Characterization of Highly Oriented Diamond Films on (001) Silicon Synthesized by Bias Enhanced Nucleation Technique

Authors: Baik, Young Joon

Issue Date: 1996-01-01

URI: https://pubs.kist.re.kr/handle/201004/85956

Appears in Collections:: KIST Conference Paper > Others

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