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Practical approach to the STEM setup parameters influencing the sensitivity of differential phase contrast image

Authors

Gwangyeob Lee; Do Hyang Kim; Hye Jung Chang

Publisher

9.9~14, Sydney

Citation

19th International Microscopy Congress

URI

https://pubs.kist.re.kr/handle/201004/87060

Appears in Collections:

KIST Conference Paper > Others

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