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투과형 엑스선 회절 분석장치용 퍼니스 및 이를 이용한 투과형 엑스선 회절 분석장치

Author

정경윤; 김동현; 디키 수산토; 장원영; 조병원; 오시형; 윤여조

Assignee

한국과학기술연구원

Regitration Date

2018-10-30

Registration No.

10113980

Application Date

2016-04-15

Application No.

15/099678

Country

US

URI

https://pubs.kist.re.kr/handle/201004/89148

Appears in Collections:

KIST Patent > 2016

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