DSpace at KISTKIST Patent2015

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dc.contributor.author윤기혁-
dc.contributor.author김성규-
dc.date.accessioned2024-01-12T14:33:33Z-
dc.date.available2024-01-12T14:33:33Z-
dc.date.issued2017-11-21-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/89280-
dc.title다시점 3D 디스플레이의 최적관찰거리(OVD) 측정방법-
dc.typePatent-
dc.date.registration2017-11-21-
dc.date.application2015-05-05-
dc.identifier.patentRegistrationNumber9826221-
dc.identifier.patentApplicationNumber14/703993-
dc.publisher.countryUS-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2015
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