Quantitative Phase Analysis using X-ray diffraction, Function of peak separation in RIR(Reference Intensity Ratio) method

Authors
Yang Bum JinLEE YUNJUJung Il DooWon, Sung Ok
Publisher
한국결정학회
Citation
한국결정학회지 = Korean Journal of Crystallography
Keywords
XRD; RIR; Quantitative; Reference Intensity Ratio
ISSN
1229-8700
URI
https://pubs.kist.re.kr/handle/201004/91572
Appears in Collections:
KIST Conference Paper > Others
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