Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 윤기혁 | - |
| dc.contributor.author | 김성규 | - |
| dc.date.accessioned | 2024-01-12T20:01:42Z | - |
| dc.date.available | 2024-01-12T20:01:42Z | - |
| dc.date.issued | 2016-04-28 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/95347 | - |
| dc.title | 다시점 3D 디스플레이의 최적관찰거리(OVD) 측정방법 | - |
| dc.type | Patent | - |
| dc.date.registration | 2016-04-28 | - |
| dc.date.application | 2014-12-09 | - |
| dc.identifier.patentRegistrationNumber | 10-1618463 | - |
| dc.identifier.patentApplicationNumber | 2014-0176200 | - |
| dc.publisher.country | KO | - |
| dc.type.iprs | 특허 | - |
| dc.contributor.assignee | 한국과학기술연구원 | - |
- Appears in Collections:
- KIST Patent > 2014
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