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Identification of sequence between overlapping signatures of different pen inks by TOF-SIMS imaging

Authors

김선희; Lee Ji-hye; LIM, WEON CHEOL; LEE, YEON HEE

Citation

표면분석심포지움

Keywords

TOF-SIMS; imaging; identification; signatures

URI

https://pubs.kist.re.kr/handle/201004/97241

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KIST Conference Paper > Others

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