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Characterization of microphase-separated diblock copolymer films by TOF-SIMS

Authors

Lee Ji-hye; Min Hwa Kang; LIM, WEON CHEOL; Kwanwoo Shin; LEE, YEON HEE

Citation

SIMS XVIII, pp.137

Keywords

sims depth profiling; diblock copolymer; ps; pprma; peha

URI

https://pubs.kist.re.kr/handle/201004/97346

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KIST Conference Paper > Others

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