Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry

Authors
LIM, WEON CHEOLLee Ji-hyeWon, Sung OkLEE, YEON HEE
Citation
8th international symposium on atomic level charaterizations for new materials and devices'11 - in conjunction with IUMAS-V -, v.1, pp.174 - 176
Keywords
CIGS; SIMS; quantitative analysis
URI
https://pubs.kist.re.kr/handle/201004/97889
Appears in Collections:
KIST Conference Paper > Others
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