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Threshold voltage instability in solution-processed silicon-zinc-tin-oxide thin film transistors

Authors

Park ki ho; Choi Jun Young; Byeong-Kwon Ju; Lee Sang Yeol

Citation

7th International Symposium on Transparent Oxide Thin Films for Electronics and Optics

URI

https://pubs.kist.re.kr/handle/201004/97962

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KIST Conference Paper > Others

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