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ELECTRICALLY TETHERED DNA STRETCHING IN NANOCHANNELS

Authors

Lee, Byung Chul; Kang Chan Min; Kim jin sik; Kang, Ji Yoon; Shin, Hyun Joon; Lee Sang Youp

Citation

ASME International Mechanical Engineering Congress and Exposition

URI

https://pubs.kist.re.kr/handle/201004/99027

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KIST Conference Paper > Others

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