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랩온어칩에서의 형광 편광 측정 방법

Author

양은경; 김정환; 김태송; 조한상; 강지윤; 신현준; 주병권

Assignee

한국과학기술연구원

Regitration Date

2010-06-11

Registration No.

4527080

Application Date

2006-05-12

Application No.

2006-134551

Country

JA

URI

https://pubs.kist.re.kr/handle/201004/99314

Appears in Collections:

KIST Patent > 2006

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