KIST Library Institutional Repository

Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices by secondary ion mass spectrometry

Authors

LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE

Citation

5th International Symposium on Practical Surface Analysis, pp.203

Keywords

CIGS; solar; quantitative; depth profile; dynamic SIMS

URI

https://pubs.kist.re.kr/handle/201004/99555

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML