| 1996-04-15 | Fabrication and magnetic properties of metal/cobalt ferrite composite thin films | Na, JG |
| 1998-03-03 | Fracture behavior in alpha-ferrite containing Al | Heo, NH; Park, CH; Na, JG |
| 1999-07 | Goss texture formation and the magnetic induction in thin-gauged 3% Si-Fe strips | Chai, KH; Na, JG; Heo, NH; Jeong, HT; Woo, JS |
| 1997-02-01 | Magnetic and electrical properties of metal/ferrite composite thin films | Na, JG |
| 1998-06-01 | Magnetic and structural properties of (Co1-xFex)Pt thin films | Jang, PW; Kim, DW; Park, CH; Na, JG; Lee, SR |
| 1998-06-01 | Magnetic induction and surface segregation in thin-gauged 3% Si steel | Heo, NH; Chai, KH; Na, JG; Woo, JS |
| 1999-07 | Magnetic properties and inhomogeneous phase transition in (FexCo0.5-x)Pt-0.5 films | Jang, PW; Park, CH; Na, JG; Lee, SR |
| 1997-10 | Microstructural studies of metal/ferrite composite thin films | Na, JG; Park, CH; Park, K; Lee, SR |
| 1996-09 | Microstructure and magnetic properties of high M(s) ferrite/metal composite thin films | Na, JG; Kim, CS |
| 1998-02-01 | Mossbauer effect study of the relaxation phenomenon of cobalt ferrite thin films | Na, JG |
| 1998-06-01 | New method to predict the magnetic properties of thin gauged Si-Fe sheets | Na, JG; Park, CH; Kim, J; Heo, NH; Lee, SR; Lee, CS; Woo, JS |
| 1999-04-15 | Nucleation and development of Goss texture and magnetic induction in thin-gauged 3% Si-Fe alloy | Heo, NH; Chai, KH; Na, JG; Kim, J; Woo, JS |
| 1998-10 | Phase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction | Na, JG; Park, CH; Heo, NH; Lee, SR; Kim, J; Park, K |
| 1998-04-03 | Study on surface magnetic domain structure of thin-gauged 3%Si-Fe strips using scanning electron microscope with polarization analyzer | Lee, Y; Koymen, AR; Heo, NH; Na, JG; Woo, JS |
| 1999-04-09 | Sulfur evaporation and magnetic induction in thin-gauged 3 % Si-Fe sheets | Heo, NH; Kim, MT; Chai, KH; Na, JG; Woo, JS |
| 1998-07 | Surface magnetic domain observation on thin-gauged 3% Si-Fe sheets by using Scanning Electron Microscopy with Polarization Analysis (SEMPA) | Lee, Y; Koymen, AR; Heo, NH; Na, JG; Woo, JS |
