- | High luminescence efficiency of Eu-doped GaN | Kim, Seong Il; Ji-Ho Park; Akihiro Wakahara; Kim, Yong Tae |
- | High luminescence efficiency of Eu-Doped GaN | Kim, Yong Tae; Park, Ji-Ho; Akihiro Wakahara |
1997-07-01 | High performance of W-B-N Schottky contact to GaAs | Kim, Yong Tae |
2010-05-31 | High-resolution X-ray photoelectron spectroscopy study of InTe thin film in structural phase transition from amorphous to crystalline phase | Lee, Young Mi; Park, Yongsup; Sun, Chang-Woo; Lee, Jeong Yong; Shin, Hyun Joon; Kim, Yong Tae; Jung, Min-Cherl |
- | HRTEM Study on the Atomic Arrangement of the Ge2Sb2Te5 Thin Films Deposited on SiO2/Si Substrates by Sputtering Method | Park Yu Jin; 이정용; 염민수; Kwon Young Suk; Kim, Yong Tae |
- | HRTEM Study on the Ordered Structure of the Metastable Ge2Sb2Te5 | Park Yu Jin; 이정용; Kim, Yong Tae |
- | Hydrogen-induced degradation and passivation of ferroelectric SrBi2Ta2O9 thin films by Au top electrode | Hoon Sang Choi; Hyun Joo Sung; Seong Gun Seo; Kim, Yong Tae; Kim, Seong Il; In-Hoon Choi |
- | I-V characteristics of a methanol concentration sensor for direct methanol fuel cell (DMFC) by using catalyst electrode of Pt dots | Kim, Seong Il; Yang Jin Seok; Kim, Yong Tae; Park, Min Chul; 박정호 |
2010-03 | I-V characteristics of a methanol concentration sensor for direct methanol fuel cell (DMFC) by using catalyst electrode of Pt dots | Yang, Jin Seok; Park, Jung Ho; Kim, Seong-Il; Kim, Yong Tae; Kim, Young Hwan |
2008-09 | I-V characteristics of a methanol sensor for direct methanol fuel cell (DMFC) as a function of deposited platinum (Pt) thickness | Yang, Jin Seok; Park, Jung Ho; Kim, Seong-Il; Kim, Seo Young; Kim, Yong Tae; Han, Il Ki |
- | Identification of Hydrogen Induced Atomic Deformation in SrBi2Nb2O9 Thin Film | KIM IK SOO; In-Hoon Choi; Kim, Yong Tae; Kim, Young Hwan; Dong Chul Yoo; Jeong Yong Lee |
- | Identification of hydrogen-induced changes in atomic deformation of ferroelectric SrBi2Nb2O9 thin film using transmission electron microscopy | Kim, Yong Tae; KIM IK SOO; Kim, Seong Il; Dong Chul Yoo; In-Hoon Choi |
- | Image Compensation of Mask Misalignment in Aerial Image Microscope System | Park, Min-Chul; Jhon, Young Min; Kim, Yong Tae |
2007-03 | Improved electromigration failure in Al based interconnects | Kim, Yong Tae; Kim, Seong-Il |
- | Improved switching speed of InSbTe multi-level phase change memory | Kim, Yong Tae; CHOI MINHO |
1999-05-18 | Improvement in diffusion barrier properties of PECVD W-N thin film by low energy BF2+ implantation | Kim, Yong Tae |
1996-01 | Improvement in the electrical properties of a (Ba, Sr)TiO3 capacitor by inserting a TiN layer between polycrystalline Si and Pt bottom electrodes | Kim, Yong Tae; Lee, Chang Woo |
2000-06-28 | Improvement of memory windows in YMnO3/Si ferroelectric gate FET | Kim, Yong Tae |
- | Improvement of Multi-Level Phase Changing Properties of SbTe based Chalcogenide Material by Substituting In for Ge | Kim, Yong Tae; KIM, CHUN KEUN; CHOI MINHO; Ahn, Jinho |
- | Improvement of W-N diffusion barrier on silicon dioxide using pulse plasma atomic layer deposition | Hyun Sang Sim; Hyeongtag Jeon; Kim, Seong Il; Kim, Yong Tae |
- | Improvement of W-N films Using WF6 Pulse Plasma Atomic Layer Deposition | Hyun Sang Sim; Park Ji Ho; Kim, Seong Il; Kim, Yong Tae |
- | In situ transmission electron microscopy study of In-Sb-Te thin films | Kim Chung Soo; Eun Tae Kim; Jeong Yong Lee; Kim, Yong Tae |
2006-09-30 | In situ transmission electron microscopy study of the nucleation and grain growth of Ge2Sb2Te5 thin films | Park, Yu Jin; Lee, Jeong Yong; Kim, Yong Tae |
2008-05-12 | In situ transmission electron microscopy study on the crystallization of GeTe binary alloy | Kim, Eun Tae; Lee, Jeong Yong; Kim, Yong Tae |
- | In situ transmission electron microscopy study on the nucleation and grain growth of Ge2Sb2Te5 thin films | Kim, Yong Tae; Park Yu Jin; Lee Jeong Yong; Kim, Seong Il; Kim, Young Hwan; Akihiro Wakahara |
2011-02 | In-Situ Detection of C-Reactive Protein Using Silicon Nanowire Field Effect Transistor | Kwon, Soon Mook; Kang, Gil Bum; Kim, Yong Tae; Kim, Young-Hwan; Ju, Byeong-Kwon |
1998-07-01 | Influence of rapid thermal annealing of cerium oxide on the morphological and electrical properties of metal/ferroelectric/insulator /semiconductor capacitor | Kim, Yong Tae |
2008-11 | Influences of partial melting and overheating on amorphization of Ge2Sb2Te5 during the reset process | Youm, Min Soo; Kim, Yong Tae; Sung, Man Young |
2019-04 | Interface-Driven Phase Transition of Phase-Change Material | Choi, Minho; Choi, Heechae; Ahn, Jinho; Kim, Yong Tae |
- | Intermediate phase transition of Ge2Sb2Te5 during melt-quenching process | CHOI MINHO; Jinho Ahn; Kim, Young-Hwan; Kim, Yong Tae |