Browsing byAuthorKim, Yong Tae

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Showing results 140 to 169 of 271

Issue DateTitleAuthor(s)
-High luminescence efficiency of Eu-doped GaNKim, Seong Il; Ji-Ho Park; Akihiro Wakahara; Kim, Yong Tae
-High luminescence efficiency of Eu-Doped GaNKim, Yong Tae; Park, Ji-Ho; Akihiro Wakahara
1997-07-01High performance of W-B-N Schottky contact to GaAsKim, Yong Tae
2010-05-31High-resolution X-ray photoelectron spectroscopy study of InTe thin film in structural phase transition from amorphous to crystalline phaseLee, Young Mi; Park, Yongsup; Sun, Chang-Woo; Lee, Jeong Yong; Shin, Hyun Joon; Kim, Yong Tae; Jung, Min-Cherl
-HRTEM Study on the Atomic Arrangement of the Ge2Sb2Te5 Thin Films Deposited on SiO2/Si Substrates by Sputtering MethodPark Yu Jin; 이정용; 염민수; Kwon Young Suk; Kim, Yong Tae
-HRTEM Study on the Ordered Structure of the Metastable Ge2Sb2Te5Park Yu Jin; 이정용; Kim, Yong Tae
-Hydrogen-induced degradation and passivation of ferroelectric SrBi2Ta2O9 thin films by Au top electrodeHoon Sang Choi; Hyun Joo Sung; Seong Gun Seo; Kim, Yong Tae; Kim, Seong Il; In-Hoon Choi
-I-V characteristics of a methanol concentration sensor for direct methanol fuel cell (DMFC) by using catalyst electrode of Pt dotsKim, Seong Il; Yang Jin Seok; Kim, Yong Tae; Park, Min Chul; 박정호
2010-03I-V characteristics of a methanol concentration sensor for direct methanol fuel cell (DMFC) by using catalyst electrode of Pt dotsYang, Jin Seok; Park, Jung Ho; Kim, Seong-Il; Kim, Yong Tae; Kim, Young Hwan
2008-09I-V characteristics of a methanol sensor for direct methanol fuel cell (DMFC) as a function of deposited platinum (Pt) thicknessYang, Jin Seok; Park, Jung Ho; Kim, Seong-Il; Kim, Seo Young; Kim, Yong Tae; Han, Il Ki
-Identification of Hydrogen Induced Atomic Deformation in SrBi2Nb2O9 Thin FilmKIM IK SOO; In-Hoon Choi; Kim, Yong Tae; Kim, Young Hwan; Dong Chul Yoo; Jeong Yong Lee
-Identification of hydrogen-induced changes in atomic deformation of ferroelectric SrBi2Nb2O9 thin film using transmission electron microscopyKim, Yong Tae; KIM IK SOO; Kim, Seong Il; Dong Chul Yoo; In-Hoon Choi
-Image Compensation of Mask Misalignment in Aerial Image Microscope SystemPark, Min-Chul; Jhon, Young Min; Kim, Yong Tae
2007-03Improved electromigration failure in Al based interconnectsKim, Yong Tae; Kim, Seong-Il
-Improved switching speed of InSbTe multi-level phase change memoryKim, Yong Tae; CHOI MINHO
1999-05-18Improvement in diffusion barrier properties of PECVD W-N thin film by low energy BF2+ implantationKim, Yong Tae
1996-01Improvement in the electrical properties of a (Ba, Sr)TiO3 capacitor by inserting a TiN layer between polycrystalline Si and Pt bottom electrodesKim, Yong Tae; Lee, Chang Woo
2000-06-28Improvement of memory windows in YMnO3/Si ferroelectric gate FETKim, Yong Tae
-Improvement of Multi-Level Phase Changing Properties of SbTe based Chalcogenide Material by Substituting In for GeKim, Yong Tae; KIM, CHUN KEUN; CHOI MINHO; Ahn, Jinho
-Improvement of W-N diffusion barrier on silicon dioxide using pulse plasma atomic layer depositionHyun Sang Sim; Hyeongtag Jeon; Kim, Seong Il; Kim, Yong Tae
-Improvement of W-N films Using WF6 Pulse Plasma Atomic Layer DepositionHyun Sang Sim; Park Ji Ho; Kim, Seong Il; Kim, Yong Tae
-In situ transmission electron microscopy study of In-Sb-Te thin filmsKim Chung Soo; Eun Tae Kim; Jeong Yong Lee; Kim, Yong Tae
2006-09-30In situ transmission electron microscopy study of the nucleation and grain growth of Ge2Sb2Te5 thin filmsPark, Yu Jin; Lee, Jeong Yong; Kim, Yong Tae
2008-05-12In situ transmission electron microscopy study on the crystallization of GeTe binary alloyKim, Eun Tae; Lee, Jeong Yong; Kim, Yong Tae
-In situ transmission electron microscopy study on the nucleation and grain growth of Ge2Sb2Te5 thin filmsKim, Yong Tae; Park Yu Jin; Lee Jeong Yong; Kim, Seong Il; Kim, Young Hwan; Akihiro Wakahara
2011-02In-Situ Detection of C-Reactive Protein Using Silicon Nanowire Field Effect TransistorKwon, Soon Mook; Kang, Gil Bum; Kim, Yong Tae; Kim, Young-Hwan; Ju, Byeong-Kwon
1998-07-01Influence of rapid thermal annealing of cerium oxide on the morphological and electrical properties of metal/ferroelectric/insulator /semiconductor capacitorKim, Yong Tae
2008-11Influences of partial melting and overheating on amorphization of Ge2Sb2Te5 during the reset processYoum, Min Soo; Kim, Yong Tae; Sung, Man Young
2019-04Interface-Driven Phase Transition of Phase-Change MaterialChoi, Minho; Choi, Heechae; Ahn, Jinho; Kim, Yong Tae
-Intermediate phase transition of Ge2Sb2Te5 during melt-quenching processCHOI MINHO; Jinho Ahn; Kim, Young-Hwan; Kim, Yong Tae

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