Browsing bySubjectCONFINED METAL LINES
Showing results 1 to 4 of 4
| Issue Date | Title | Author(s) |
|---|---|---|
| 2001-05-25 | Electromigration-induced stress interaction between vias and polygranular clusters | Park, YJ; Joo, YC |
| 2002-02-01 | Electromigration-induced via failure assisted by neighboring clusters | Choi, IS; Park, YJ; Joo, YC |
| 1999-04-01 | Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnects | Park, YJ; Andleigh, VK; Thompson, CV |
| 1997-11-01 | The effects of the stress dependence of atomic diffusivity on stress evolution due to electromigration | Park, YJ; Thompson, CV |
KIST 리포지터리는 국립중앙도서관 OAK 보급사업으로 구축되었습니다.