Showing results 9 to 15 of 15
Issue Date | Title | Author(s) |
---|---|---|
- | Post-treatment induced resistivity changes of undoped diamond thin films | 이범주; PARK YOUNG JOON; 안병태; EUN KWANG YONG; Baik Young Joon |
- | Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnects | Vaibhav K. Andleigh; PARK YOUNG JOON; Carl V. Thompson |
- | Stress effect on interconnect reliability due to electromigration | PARK YOUNG JOON; 주영창 |
- | Temperature dependence of abnormal growth of faceted grains in a liquid matrix. | PARK YOUNG JOON; 윤덕용; PARK CHAN WOO |
- | The effects of post annealing on the electrical characteristics of thin PECVD oxide. | PARK YOUNG JOON; 노태문; 백종태; 남기수 |
- | ULSI interconnect failures due to electromigration-induced stress evolution: computer simulation study | PARK YOUNG JOON; Vaibhav K. Andleigh; Carl V. Thompson; 최인석; 주영창 |
2001-10 | 구리배선의 electromigration 신뢰성 | PARK YOUNG JOON |