New technique of measuring a spin polarization in patterned device by using scanning point contact Andreev reflection method

Authors
김경호Lee SuyounKim Hyung-junKoo, Hyun CheolHan, Suk Hee
Citation
2008 하계 자기학회
Keywords
PCAR; spin polarization
URI
https://pubs.kist.re.kr/handle/201004/102005
Appears in Collections:
KIST Conference Paper > Others
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