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New technique of measuring a spin polarization in patterned device by using scanning point contact Andreev reflection method

Authors

김경호; Lee Suyoun; Kim Hyung-jun; Koo, Hyun Cheol; Han, Suk Hee

Citation

2008 하계 자기학회

Keywords

PCAR; spin polarization

URI

https://pubs.kist.re.kr/handle/201004/102005

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KIST Conference Paper > Others

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