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Full Integration and Cell Characteristics for 64Mb Nonvolatile PRAM

Authors

S.H. Lee; Y.N. Hwang; S.Y. Lee; K.C. Ryoo; S.J. Ahn; Koo, Hyun Cheol; C.W. Jeong; Y.-T. Kim; G.H. Koh; G.T. Jeong; H.S. Jeong; Kinam Kim

Citation

2004 Symposium on VLSI Technology-Digest of Technical Papers, pp.20 - 21

Keywords

full integration; 64Mb; PRAM; high density; cell characteristics

URI

https://pubs.kist.re.kr/handle/201004/105808

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KIST Conference Paper > Others

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