Dependence of the intermixing of InGaAs/InGaAsP quantum well on NH₃ flow rate for the growth of SiNx capping layer

Authors
Choi, Won JunH. T YiWoo, Deok HaLee, Jung Il
Citation
The First International Symposium on Future Issues in Nano-optoelectronics, pp.74 - 78
Keywords
quantum well; intermixing; flow rate; capping layer; impurity free impurity free
URI
https://pubs.kist.re.kr/handle/201004/106000
Appears in Collections:
KIST Conference Paper > Others
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