Solid-phase epitaxial regrowth and dopant activation of arsenic-implanted metastable pseudomorphic Ge0.08Si0.92 and Ge0.16Si0.84 on Si(100)

Authors
D.Y.C. LieSONG JONG HANM.-A. NicoletM.O. TannerS. ThomasK.L. Wang
Citation
Material Research Society Symposium Proceedings, v.379, pp.467 - 472
URI
https://pubs.kist.re.kr/handle/201004/111934
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KIST Conference Paper > Others
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