Enhanced device performances of WSe2-MoS2 van der Waals junction p-n diode by fluoropolymer encapsulation

Authors
Jeon, Pyo JinMin, Sung-WookKim, Jin SungRaza, Syed Raza AliChoi, KyungheeLee, Hee SungLee, Young TackHwang, Do KyungChoi, Hyoung JoonIm, Seongil
Issue Date
2015-03
Publisher
ROYAL SOC CHEMISTRY
Citation
JOURNAL OF MATERIALS CHEMISTRY C, v.3, no.12, pp.2751 - 2758
Abstract
Two-dimensional heterojunction diodes with WSe2 and MoS2 nanoflakes respectively as p-and n-type semiconductors were fabricated on both glass and SiO2/p(+)-Si by direct imprinting. Superior electrostatic and dynamic performances were acquired from the diode on glass when an electric dipole-containing fluoropolymer was employed for encapsulation: forward and reverse current toward ideal behavior, enhanced aging/ambient stability, and improved dynamic rectification resulted.
Keywords
BIAS LEAKAGE CURRENT; SURFACE-CHEMISTRY; LAYER MOS2; WSE2; GATE; TRANSISTORS; MONOLAYERS; BIAS LEAKAGE CURRENT; SURFACE-CHEMISTRY; LAYER MOS2; WSE2; GATE; TRANSISTORS; MONOLAYERS; WSe2; MoS2; van der Waals junction p?n diode; fluoropolymer encapsulation
ISSN
2050-7526
URI
https://pubs.kist.re.kr/handle/201004/125735
DOI
10.1039/c4tc02961e
Appears in Collections:
KIST Article > 2015
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