Correlation between the microstructures and the cycling performance of RuO2 electrodes for thin-film microsupercapacitors

Authors
Kim, HKSeong, TYLim, JHOk, YWCho, WIShin, YHYoon, YS
Issue Date
2002-09
Publisher
A V S AMER INST PHYSICS
Citation
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.20, no.5, pp.1827 - 1832
Abstract
We have fabricated all solid-state thin-film microsupercapacitors (TFSCs) using RuO2 electrodes and UPON electrolytes. The RuO2 electrodes were grown at oxygen gas flow ratios [O-2/(O-2 +Ar)] of 10% and 30%. Room-temperature charge-discharge measurements show that specific capacitance is dependent on the oxygen gas flow ratio. Glancing angle x-ray diffraction (GXRD) and transmission electron microscopy (TEM) results show that the RuO2 electrodes grown at 10% contain nanocrystallites (0.7-10 nm across) embedded in the amorphous matrix, while the electrodes grown at 30% are polycrystalline (with grains of 0.7-15 nm in diameter). Based on the GXRD, TEM, Auger electron spectroscopy depth profile, and scanning electron microscopy results, the oxygen flow ratio dependence of the cycling performance of the RuO2-based TFSCs are discussed in terms of the combined effects of the microstructures of the electrodes, interfacial products, and the surface morphology of the electrodes. (C) 2002 American Vacuum Society.
Keywords
RUTHENIUM OXIDE; RUTHENIUM OXIDE; thin film supercapacitor
ISSN
1071-1023
URI
https://pubs.kist.re.kr/handle/201004/139266
DOI
10.1116/1.1500752
Appears in Collections:
KIST Article > 2002
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