Correlation between the microstructures and the cycling performance of RuO2 electrodes for thin-film microsupercapacitors
- Authors
- Kim, HK; Seong, TY; Lim, JH; Ok, YW; Cho, WI; Shin, YH; Yoon, YS
- Issue Date
- 2002-09
- Publisher
- A V S AMER INST PHYSICS
- Citation
- JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.20, no.5, pp.1827 - 1832
- Abstract
- We have fabricated all solid-state thin-film microsupercapacitors (TFSCs) using RuO2 electrodes and UPON electrolytes. The RuO2 electrodes were grown at oxygen gas flow ratios [O-2/(O-2 +Ar)] of 10% and 30%. Room-temperature charge-discharge measurements show that specific capacitance is dependent on the oxygen gas flow ratio. Glancing angle x-ray diffraction (GXRD) and transmission electron microscopy (TEM) results show that the RuO2 electrodes grown at 10% contain nanocrystallites (0.7-10 nm across) embedded in the amorphous matrix, while the electrodes grown at 30% are polycrystalline (with grains of 0.7-15 nm in diameter). Based on the GXRD, TEM, Auger electron spectroscopy depth profile, and scanning electron microscopy results, the oxygen flow ratio dependence of the cycling performance of the RuO2-based TFSCs are discussed in terms of the combined effects of the microstructures of the electrodes, interfacial products, and the surface morphology of the electrodes. (C) 2002 American Vacuum Society.
- Keywords
- RUTHENIUM OXIDE; RUTHENIUM OXIDE; thin film supercapacitor
- ISSN
- 1071-1023
- URI
- https://pubs.kist.re.kr/handle/201004/139266
- DOI
- 10.1116/1.1500752
- Appears in Collections:
- KIST Article > 2002
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