Thick AlxGa1-xAs: An intrinsically percolating barrier owing to its microscopic structural inhomogeneity

Authors
Kim, DSKo, HSKim, YMRhee, SJHong, SCYee, YHYee, DSWoo, JCChoi, HJIhm, JWoo, DHKang, KN
Issue Date
1996-10-21
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.69, no.17, pp.2513 - 2515
Abstract
A significant charge transfer, which differs from tunneling, over thick AlxGa1-xAs barrier in GaAs/AlxGa1-xAs asymmetric double quantum wells is studied by cw photoluminescence excitation (PLE) and time-resolved photoluminescence. It is found that 300-Angstrom-thick Al0.3Ga0.7As barrier is universally ''leaky'' with transport time of similar to 300 ps, while AlAs and AlAs/GaAs digital alloy barriers with same thickness are not. Aided by a model calculation, we suggest that the intrinsic inhomogeneities in the alloy, which recent x-ray and scanning tunneling microscope studies revealed, may be responsible. (C) 1996 American Institute of Physics.
Keywords
SCANNING-TUNNELING-MICROSCOPY; SCANNING-TUNNELING-MICROSCOPY
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/144264
DOI
10.1063/1.117724
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KIST Article > Others
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