Thick AlxGa1-xAs: An intrinsically percolating barrier owing to its microscopic structural inhomogeneity
- Authors
- Kim, DS; Ko, HS; Kim, YM; Rhee, SJ; Hong, SC; Yee, YH; Yee, DS; Woo, JC; Choi, HJ; Ihm, J; Woo, DH; Kang, KN
- Issue Date
- 1996-10-21
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.69, no.17, pp.2513 - 2515
- Abstract
- A significant charge transfer, which differs from tunneling, over thick AlxGa1-xAs barrier in GaAs/AlxGa1-xAs asymmetric double quantum wells is studied by cw photoluminescence excitation (PLE) and time-resolved photoluminescence. It is found that 300-Angstrom-thick Al0.3Ga0.7As barrier is universally ''leaky'' with transport time of similar to 300 ps, while AlAs and AlAs/GaAs digital alloy barriers with same thickness are not. Aided by a model calculation, we suggest that the intrinsic inhomogeneities in the alloy, which recent x-ray and scanning tunneling microscope studies revealed, may be responsible. (C) 1996 American Institute of Physics.
- Keywords
- SCANNING-TUNNELING-MICROSCOPY; SCANNING-TUNNELING-MICROSCOPY
- ISSN
- 0003-6951
- URI
- https://pubs.kist.re.kr/handle/201004/144264
- DOI
- 10.1063/1.117724
- Appears in Collections:
- KIST Article > Others
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