Electrical properties of PZT-PCW thick film on Pt/SiC/Si, and structural stability of SiCas buffer layer

Authors
CHOI KI YONGDuck-kyun ChoiJi-Yeun ParkYoon, Dae SungKim, Tae Song
Issue Date
2004-04
Citation
ISIF 2004
Keywords
SiC membrane; PZT-PCW; electrical property; structural stability
URI
https://pubs.kist.re.kr/handle/201004/82582
Appears in Collections:
KIST Conference Paper > 2004
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