KIST Library Institutional Repository

C-V characteristics of Pt/SrBi2Ta2O9/CeO2/Si structure for non volatile memory devices

Authors

Kim, Yong Tae

Issue Date

1997-07-01

Citation

European Solid State Device Research Conference, pp.756 - 759

URI

https://pubs.kist.re.kr/handle/201004/85510

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML