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객관적 시야 검사를 위한 망막 신경절 세포 밀도 지도

Author

김재헌; 오주영; 김대유; 이경민; 김석환

Assignee

한국과학기술연구원

Regitration Date

2019-09-20

Registration No.

10-2025769

Application Date

2017-11-29

Application No.

2017-0161981

Country

KO

URI

https://pubs.kist.re.kr/handle/201004/91920

Appears in Collections:

KIST Patent > 2017

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