Identification of sequence between overlapping signatures of different pen inks by TOF-SIMS imaging

Authors
김선희Lee Ji-hyeLIM, WEON CHEOLLEE, YEON HEE
Citation
표면분석심포지움
Keywords
TOF-SIMS; imaging; identification; signatures
URI
https://pubs.kist.re.kr/handle/201004/97241
Appears in Collections:
KIST Conference Paper > Others
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