2016-05 | Time-of-flight secondary ion mass spectrometry as a tool for evaluating the plasma-induced hydrogenation of graphene | Wallace, Joshua S.; Quinn, Austin; Gardella, Joseph A., Jr.; Hu, Jing; Kong, Eric Siu-Wai; Joh, Han-Ik |
2003-12 | Time-of-Flight Secondary Ion Mass Spectrometry for Surface Analysis | 이연희 |
- | Time-of-flight secondary ion mass spectrometry of substituted polystyrenes. | LEE YEON HEE; HAN SEUNG HEE |
- | TOF-SIMS Analysis of fabrics with natural dyes and synthetic dyes | Lee Ji-hye; LEE, YEON HEE |
- | TOF-SIMS and XPS analysis of ancient and forensic materials | LEE, YEON HEE; Lee Ji-hye; 함승욱; LEE, KANG BONG; 김강진 |
2004-06-15 | TOF-SIMS study of modified polymer surfaces | Lee, Y; Han, S; Kwon, MH |
- | TOF-SIMS Study of red sealing-inks on paper and its forensic applications | Lee Ji-hye; Chiwoo Lee; LEE, KANG BONG; LEE, YEON HEE |
2008-12-15 | TOF-SIMS study of red sealing-inks on paper and its forensic applications | Lee, Jihye; Lee, Chiwoo; Lee, Kangbong; Lee, Yeonhee |
2016-11 | Wear Characteristics of Fluorocarbon Thin Films Deposited Using Inductively Coupled and Capacitively Coupled Plasma Methods | Cho, Youn-Jeong; Jang, Yun Jung; Han, Seunghee; Lee, Yeonhee |
2000-12 | 고분자 표면분석을 위한 비행시간형 이차이온 질량분석(TOF-SIMS) 기술 | 이연희 |
- | (Undefined) | 김선희; LIM, WEON CHEOL; LEE, YEON HEE |