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Showing results 1 to 30 of 50

Issue DateTitleAuthor(s)
2002-03-01Adsorption characteristics of SO2 on activated carbon prepared from coconut shell with potassium hydroxide activationLee, YW; Park, JW; Choung, JH; Choi, DK
-Analysis of fluorine-containing thin films using surface techniquesYoungsoo, Kim; Kang-Jin Kim; LEE, YEON HEE
2014-11Analysis of natural dyes in archeological textiles using TOF-SIMS and other analytical techniquesLee, Jihye; Kim, Man-Ho; Lee, Kang-Bong; van Elslande, Elsa; Walter, Philippe; Lee, Yeonhee
2001-06Application of time-of-flight secondary ion mass spectrometry to automobile paint analysisLee, Y; Han, S; Yoon, JH; Kim, YM; Shon, SK; Park, SW
-Applications of surface analytical techniques for organic materials in archaeology or forensic scienceLEE, YEON HEE; Lee Ji-hye; S. Ham; LEE, KANG BONG
-Applications of TOF-SIMS for organic materials in archaeology and forensic sicenceLEE, YEON HEE; Lee Ji-hye; Youngsoo, Kim; Seokchan Choi; Seung Wook Ham; LEE, KANG BONG; Chiwoo Lee; Kang-Jin Kim
2014-11Characterization and sequence determination of pen inks, red sealing inks, and laser toners by TOF-SIMS and ATR FTIRLee, Jihye; Kim, Seon Hee; Cho, Youn-Jeong; Nam, Yun Sik; Lee, Kang-Bong; Lee, Yeonhee
2012-06Characterization of dyed textiles using TOF-SIMS and FT-IRLee, Jihye; Ceglia, A.; Kim, Kang-Jin; Lee, Yeonhee
-Characterization of fluorocarbon fhin films deposited by ICP and PPLee Ji-hye; K. Kim; LEE, YEON HEE
2013-05Characterization of Natural Dyes and Traditional Korean Silk Fabric by Surface Analytical TechniquesLee, Jihye; Kang, Min Hwa; Lee, Kang-Bong; Lee, Yeonhee
-Characterization of organic compounds on modified polyimide surfaces using TOF-SIMS in combination with derivatizationLEE, YEON HEE; KWON MOON HEE; Hong Ju Hi; Youngsoo, Kim
-Characterization of solid surfaces using time-of-flight secondary ion mass spectrometry.LEE YEON HEE; HAN SEUNG HEE; Lee junghye; 윤정현
2015-12Characterization of traditional Korean lacquers using surface analytical techniquesLee, Jihye; Kim, Min Jung; Kim, Man-Ho; Doh, Jung-Mann; Hahn, Hoh-Gyu; Lee, Yeonhee
2014-11Comparison of nanostructured blend homopolymers and diblock copolymers by AFM and TOF-SIMSKang, Minhwa; Lee, Jihye; Lee, Yeonhee
2011-01Depth profiling of lamella-phase diblock copolymers using SIMSLee, Yeonhee; Lee, Jihye; Lim, Weon Cheol; Shin, Kwanwoo; Kim, Kang-Jin
-Development of the microprobe analytical method of TOF-SIMS with derivatization reaction for PSII-treated polymer surfacesKWON MOON HEE; HAN, SEUNG HEE; LEE, YEON HEE; Hae-Dong Kim
1998-04-15Enhancement of selective chemical vapor deposition of copper by nitrogen plasma pretreatmentKim, YS; Kim, DJ; Kwak, SK; Kim, EK; Min, SK; Jung, DG
2021-07Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass SpectrometryLee, Jihye; Lee, Yeonhee
-Identification of automotive paints using time-of-flight secondary ion mass spectrometryLEE YEON HEE; HAN SEUNG HEE; 윤정현; KIM YOUNG MAN; 손성건; 박성우
-Identification of automotive paints using time-of-flight secondary ion mass spectrometryLEE YEON HEE; HAN SEUNG HEE; 윤정현; KIM YOUNG MAN; 손성건; 박성우
2015-11Identification of Natural Dyes in Ancient Textiles by Time-of-Flight Secondary Ion Mass Spectrometry and Surface-Enhanced Raman SpectroscopyLee, Jihye; Kim, Min Jung; van Elslande, Elsa; Walter, Philippe; Lee, Yeonhee
-Identification of sequence between overlapping signatures of different pen inks by TOF-SIMS imaging김선희; Lee Ji-hye; LIM, WEON CHEOL; LEE, YEON HEE
-Investigation of Microphase Separation of Diblock Copolymers by TOF-SIMS and AFMLEE, YEON HEE; 이지혜; Minhwa Kang; Kwanwoo Shin
-Investigation of natural dyes and ancient textiles from Korea using TOF-SIMSLEE, YEON HEE; Lee Ji-hye; Youngsoo, Kim; Kang-Jin Kim; Seungwook Ham
2008-12-15Investigation of natural dyes and ancient textiles from korea using TOF-SIMSLee, Yeonhee; Lee, Jihye; Kim, Youngsoo; Choi, Seokchan; Ham, Seung Wook; Kim, Kang-Jin
-Qualitative analysis of the red stamping inks in the document using TOF-SIMSCho Youn Jeang; Lee Ji-hye; 윤정현; LEE, YEON HEE
-Qualitative analysis of the red stamping inks on paper using TOF-SIMSLee Ji-hye; Chiwoo Lee; LEE, YEON HEE
-Quantitative Analysis of Metal Alloy by TOF-SIMS Depth ProfilingLIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE
2006-07-30Selective detection of organic compounds on modified polymer surfaces using TOF-SIMS in combination with derivatizationKwon, Moonhee; Lee, Yeonhee; Kim, Youngsoo; Han, Seunghee; Kim, Haidong
2003-01-15Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometryLee, Y; Han, S; Kwon, MH; Lim, H; Kim, YS; Chun, H; Kim, JS

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