Design and fabrication of multi-layer antireflection coating for III-V solar cell

Authors
Jung, Sung-MokKim, Young-HwanKim, Seong-IlYoo, Sang-Im
Issue Date
2011-05
Publisher
ELSEVIER SCIENCE BV
Citation
CURRENT APPLIED PHYSICS, v.11, no.3, pp.538 - 541
Abstract
ZnS and ZnS-MgF2 composite films were prepared on soda-lime glass substrates and MgF2 films on GaAs by rf magnetron sputtering to investigate multi-layer antireflection (AR) coatings. Optical constants of these films were determined by envelope method and spectroscopic ellipsometry. In particular, ZnS-MgF2 composite films were fabricated by co-sputtering of ZnS and MgF2 target to obtain intermediate refractive index material for a middle layer in the triple-layer AR coating and these films exhibited the desired intermediate refractive index. Based on the extracted optical constants, single-, double- and triple-layer AR coatings on GaAs substrates were designed and fabricated by rf magnetron sputtering. Low reflectance could be obtained from single-layer AR coating only at a specific wavelength and could be obtained from multi-layer AR coating at wide wavelength regime. Additionally, incident angle dependence of the reflectance of the multi-layer AR coatings was also investigated and showed different behavior according to a number of layers. (C) 2010 Elsevier B.V. All rights reserved.
Keywords
THIN-FILMS; OPTICAL-PROPERTIES; POROUS SILICON; TEMPERATURE; EVAPORATION; DEPOSITION; THICKNESS; CONSTANTS; THIN-FILMS; OPTICAL-PROPERTIES; POROUS SILICON; TEMPERATURE; EVAPORATION; DEPOSITION; THICKNESS; CONSTANTS; Zinc sulfide; Magnesium fluoride; Antireflection coating; Optical constants; rf magnetron sputtering
ISSN
1567-1739
URI
https://pubs.kist.re.kr/handle/201004/130385
DOI
10.1016/j.cap.2010.09.010
Appears in Collections:
KIST Article > 2011
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