Design and fabrication of multi-layer antireflection coating for III-V solar cell
- Authors
- Jung, Sung-Mok; Kim, Young-Hwan; Kim, Seong-Il; Yoo, Sang-Im
- Issue Date
- 2011-05
- Publisher
- ELSEVIER SCIENCE BV
- Citation
- CURRENT APPLIED PHYSICS, v.11, no.3, pp.538 - 541
- Abstract
- ZnS and ZnS-MgF2 composite films were prepared on soda-lime glass substrates and MgF2 films on GaAs by rf magnetron sputtering to investigate multi-layer antireflection (AR) coatings. Optical constants of these films were determined by envelope method and spectroscopic ellipsometry. In particular, ZnS-MgF2 composite films were fabricated by co-sputtering of ZnS and MgF2 target to obtain intermediate refractive index material for a middle layer in the triple-layer AR coating and these films exhibited the desired intermediate refractive index. Based on the extracted optical constants, single-, double- and triple-layer AR coatings on GaAs substrates were designed and fabricated by rf magnetron sputtering. Low reflectance could be obtained from single-layer AR coating only at a specific wavelength and could be obtained from multi-layer AR coating at wide wavelength regime. Additionally, incident angle dependence of the reflectance of the multi-layer AR coatings was also investigated and showed different behavior according to a number of layers. (C) 2010 Elsevier B.V. All rights reserved.
- Keywords
- THIN-FILMS; OPTICAL-PROPERTIES; POROUS SILICON; TEMPERATURE; EVAPORATION; DEPOSITION; THICKNESS; CONSTANTS; THIN-FILMS; OPTICAL-PROPERTIES; POROUS SILICON; TEMPERATURE; EVAPORATION; DEPOSITION; THICKNESS; CONSTANTS; Zinc sulfide; Magnesium fluoride; Antireflection coating; Optical constants; rf magnetron sputtering
- ISSN
- 1567-1739
- URI
- https://pubs.kist.re.kr/handle/201004/130385
- DOI
- 10.1016/j.cap.2010.09.010
- Appears in Collections:
- KIST Article > 2011
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