AlN 열방출층 및 TiN 전극이 적용된 상변화 메모리

Author
김성일김용태김인수김춘근염민수김영환
Assignee
한국과학기술연구원
Regitration Date
2007-12-11
Registration No.
7,307,269
Application Date
2005-11-08
Application No.
11/270711
Country
US
URI
https://pubs.kist.re.kr/handle/201004/84514
Appears in Collections:
KIST Patent > 2005
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