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Effects of post-annealing temperature on electrical performances in amorphous SiInZnO thin film transistor

Authors

Kim, Bo Seul; Kim Do Hyung; You Dongyoun; Lee Sang Yeol

Citation

한국전기전자재료학회

URI

https://pubs.kist.re.kr/handle/201004/97821

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KIST Conference Paper > Others

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