Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
---|---|---|
2023-03 | Highly Reliable Electrochemical Metallization Threshold Switch Through Conductive Filament Engineering Using Two-Dimensional PtSe2 Insertion Layer | Kim, Min-Su; Park, Euyjin; Kim, Seung-Geun; Park, Jae-Hyeun; Kim, Seung-Hwan; Han, Kyu-Hyun; Yu, Hyun-Yong |
2017-11-08 | Reliable Multistate Data Storage with Low Power Consumption by Selective Oxidation of Pyramid-Structured Resistive Memory | Kirn, Youngjin; Choi, Hanhyeong; Park, Hyun S.; Kang, Moon Sung; Shin, Keun-Young; Lee, Sang-Soo; Park, Jong Hyuk |