Showing results 3 to 4 of 4
Issue Date | Title | Author(s) |
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1999-04-01 | Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnects | Park, YJ; Andleigh, VK; Thompson, CV |
1997-11-01 | The effects of the stress dependence of atomic diffusivity on stress evolution due to electromigration | Park, YJ; Thompson, CV |