Showing results 72 to 101 of 105
Issue Date | Title | Author(s) |
---|---|---|
2012-09 | Reduction of Charge Trapping in HfO2 Film on Ge Substrates by Atomic Layer Deposition of Various Passivating Interfacial Layers | Jung, Hyung-Suk; Yu, Il-Hyuk; Kim, Hyo Kyeom; Lee, Sang Young; Lee, Joohwi; Choi, Yujin; Chung, Yoon Jang; Lee, Nae-In; Park, Tae Joo; Choi, Jung-Hae; Hwang, Cheol Seong |
2019-07 | Reduction of the Hysteresis Voltage in Atomic-Layer-Deposited p-Type SnO Thin-Film Transistors by Adopting an Al2O3 Interfacial Layer | Jang, Younjin; Yeu, In Won; Kim, Jun Shik; Han, Jeong Hwan; Choi, Jung-Hae; Hwang, Cheol Seong |
2017-08-28 | Regulation of transport properties by polytypism: a computational study on bilayer MoS2 | Banerjee, Swastika; Park, Jaehong; Hwang, Cheol Seong; Choi, Jung-Hae; Lee, Seung-Cheol; Pati, Swapan K. |
2016-05 | Relaxation oscillator-realized artificial electronic neurons, their responses, and noise | Lim, Hyungkwang; Ahn, Hyung-Woo; Kornijcuk, Vladimir; Kim, Guhyun; Seok, Jun Yeong; Kim, Inho; Hwang, Cheol Seong; Jeong, Doo Seok |
2015-05-13 | Reliability of neuronal information conveyed by unreliable neuristor-based leaky integrate-and-fire neurons: a model study | Lim, Hyungkwang; Kornijcuk, Vladimir; Seok, Jun Yeong; Kim, Seong Keun; Kim, Inho; Hwang, Cheol Seong; Jeong, Doo Seok |
2016-02-02 | Resistance switching behavior of atomic layer deposited SrTiO3 film through possible formation of Sr2Ti6O13 or Sr1Ti11O20 phases | Lee, Woongkyu; Yoo, Sijung; Yoon, Kyung Jean; Yeu, In Won; Chang, Hye Jung; Choi, Jung-Hae; Hoffmann-Eifert, Susanne; Waser, Rainer; Hwang, Cheol Seong |
2014-08-11 | Resistance switching in epitaxial SrCoOx thin films | Tambunan, Octolia T.; Parwanta, Kadek J.; Acharya, Susant K.; Lee, Bo Wha; Jung, Chang Uk; Kim, Yeon Soo; Park, Bae Ho; Jeong, Huiseong; Park, Ji-Yong; Cho, Myung Rae; Park, Yun Daniel; Choi, Woo Seok; Kim, Dong-Wook; Jin, Hyunwoo; Lee, Suyoun; Song, Seul Ji; Kang, Sung-Jin; Kim, Miyoung; Hwang, Cheol Seong |
2023-08 | Roadmap on ferroelectric hafnia- and zirconia-based materials and devices | Silva, Jose P. B.; Alcala, Ruben; Avci, Uygar E.; Barrett, Nick; Begon-Lours, Laura; Borg, Mattias; Byun, Seungyong; Chang, Sou-Chi; Cheong, Sang-Wook; Choe, Duk-Hyun; Coignus, Jean; Deshpande, Veeresh; Dimoulas, Athanasios; Dubourdieu, Catherine; Fina, Ignasi; Funakubo, Hiroshi; Grenouillet, Laurent; Gruverman, Alexei; Heo, Jinseong; Hoffmann, Michael; Hsain, H. Alex; Huang, Fei-Ting; Hwang, Cheol Seong; Iniguez, Jorge; Jones, Jacob L.; Karpov, Ilya V.; Kersch, Alfred; Kwon, Taegyu; Lancaster, Suzanne; Lederer, Maximilian; Lee, Younghwan; Lomenzo, Patrick D.; Martin, Lane W.; Martin, Simon; Migita, Shinji; Mikolajick, Thomas; Noheda, Beatriz; Park, Min Hyuk; Rabe, Karin M.; Salahuddin, Sayeef; Sanchez, Florencio; Seidel, Konrad; Shimizu, Takao; Shiraishi, Takahisa; Slesazeck, Stefan; Toriumi, Akira; Uchida, Hiroshi; Vilquin, Bertrand; Xu, Xianghan; Ye, Kun Hee; Schroeder, Uwe |
2019-08 | Role of the Short-Range Order in Amorphous Oxide on MoS2/a-SiO2 and MoS2/a-HfO2 Interfaces | Park, Jaehong; Yeu, In Won; Han, Gyuseung; Hwang, Cheol Seong; Choi, Jung-Hae |
2013-09-27 | Short-term memory of TiO2-based electrochemical capacitors: empirical analysis with adoption of a sliding threshold | Lim, Hyungkwang; Kim, Inho; Kim, Jin-Sang; Hwang, Cheol Seong; Jeong, Doo Seok |
2012-12-07 | Strain evolution of each type of grains in poly-crystalline (Ba,Sr)TiO3 thin films grown by sputtering | Park, Woo Young; Park, Min Hyuk; Lee, Jong Ho; Yoon, Jung Ho; Han, Jeong Hwan; Choi, Jung-Hae; Hwang, Cheol Seong |
2014-12-24 | Structure and Electrical Properties of Al-Doped HfO2 and ZrO2 Films Grown via Atomic Layer Deposition on Mo Electrodes | Yoo, Yeon Woo; Jeon, Woojin; Lee, Woongkyu; An, Cheol Hyun; Kim, Seong Keun; Hwang, Cheol Seong |
2024-04 | Study of a charge transition-driven resistive switching mechanism in TiO2-based random access memory via density functional theory | Jeong, Taeyoung; Yeu, In Won; Ye, Kun Hee; Yoon, Seungjae; Kim, Dohyun; Hwang, Cheol Seong; Choi, Jung-Hae |
2013-10 | Study on the defects in metal-organic chemical vapor deposited zinc tin oxide thin films using negative bias illumination stability analysis | Kim, Un Ki; Rha, Sang Ho; Kim, Jeong Hwan; Chung, Yoon Jang; Jung, Jisim; Hwang, Eun Suk; Lee, Joohwi; Park, Tae Joo; Choi, Jung-Hae; Hwang, Cheol Seong |
2020-10 | Substrate Surface Modification for Enlarging Two-Dimensional SnS Grains at Low Temperatures | Baek, In-Hwan; Cho, Ah-Jin; Kim, Sangtae; Lee, Ga Yeon; Han, Jeong Hwan; Chung, Taek-Mo; Baek, Seung-Hyub; Kang, Chong-Yun; Kim, Jin-Sang; Hwang, Cheol Seong; Kim, Seong Keun |
2017-09-06 | Surface reconstruction of InAs (001) depending on the pressure and temperature examined by density functional thermodynamics | Yeu, In Won; Park, Jaehong; Han, Gyuseung; Hwang, Cheol Seong; Choi, Jung-Hae |
2015-02-16 | Symmetry-dependent interfacial reconstruction to compensate polar discontinuity at perovskite oxide interfaces (LaAlO3/SrTiO3 and LaAlO3/CaTiO3) | Lee, Joohwi; Choi, Jong Kwon; Moon, Seon Young; Park, Jaehong; Kim, Jin-Sang; Hwang, Cheol Seong; Baek, Seung-Hyub; Choi, Jung-Hae; Chang, Hye Jung |
2017-10-10 | Synthesis of SnS Thin Films by Atomic Layer Deposition at Low Temperatures | Baek, In-Hwan; Pyeon, Jung Joon; Song, Young Geun; Chung, Taek-Mo; Kim, Hae-Ryoung; Baek, Seung-Hyub; Kim, Jin-Sang; Kang, Chong-Yun; Choi, Ji-Won; Hwang, Cheol Seong; Han, Jeong Hwan; Kim, Seong Keun |
2017-09-28 | Ta-Doped SnO2 as a reduction-resistant oxide electrode for DRAM capacitors | Cho, Cheol Jin; Noh, Myoung-Sub; Lee, Woo Chul; An, Cheol Hyun; Kang, Chong-Yun; Hwang, Cheol Seong; Kim, Seong Keun |
2022-10 | Temperature-dependent bandgap of (In,Ga)As via P5Grand: A Python Package for Property Prediction of Pseudobinary systems using Grand canonical ensemble | Han Gyu Seung; Yeu In Won; Ye, Kun Hee; Yoon SeungJae; Jeong, Tae Young; Lee, Seung-Cheol; Hwang, Cheol Seong; Choi, Jung-Hae |
2012-04-30 | The charge trapping characteristics of Si3N4 and Al2O3 layers on amorphous-indium-gallium-zinc oxide thin films for memory application | Jung, Ji Sim; Rha, Sang-Ho; Kim, Un Ki; Chung, Yoon Jang; Jung, Yoon Soo; Choi, Jung-Hae; Hwang, Cheol Seong |
2022-07 | The Contrasting Impacts of the Al2O3 and Y2O3 Insertion Layers on the Crystallization of ZrO2 Films for Dynamic Random Access Memory Capacitors | Seo, Haengha; Yeu, In Won; Kwon, Dae Seon; Kim, Dong Gun; Lim, Junil; Kim, Tae Kyun; Paik, Heewon; Choi, Jung-Hae; Hwang, Cheol Seong |
2013-03 | The Electrical Properties of Asymmetric Schottky Contact Thin-Film Transistors with Amorphous-In2Ga2ZnO7 | Rha, Sang Ho; Kim, Un Ki; Jung, Jisim; Kim, Hyo Kyeom; Jung, Yoon Soo; Hwang, Eun Suk; Chung, Yoon Jang; Lee, Mijung; Choi, Jung-Hae; Hwang, Cheol Seong |
2012-07 | The Impact of Carbon Concentration on the Crystalline Phase and Dielectric Constant of Atomic Layer Deposited HfO2 Films on Ge Substrate | Jung, Hyung-Suk; Jeon, Sang Ho; Kim, Hyo Kyeom; Yu, Il-Hyuk; Lee, Sang Young; Lee, Joohwi; Chung, Yoon Jang; Cho, Deok-Yong; Lee, Nae-In; Park, Tae Joo; Choi, Jung-Hae; Han, Seungwu; Hwang, Cheol Seong |
2013-06-17 | Theoretical and experimental studies on the electronic structure of crystalline and amorphous ZnSnO3 thin films | Lee, Joohwi; Cho, Deok-Yong; Jung, Jisim; Kim, Un Ki; Rha, Sang Ho; Hwang, Cheol Seong; Choi, Jung-Hae |
2019-12-15 | Theoretical understanding of the catalyst-free growth mechanism of GaAs < 111 > B nanowires | Yeu, In Won; Han, Gyuseung; Park, Jaehong; Hwang, Cheol Seong; Choi, Jung-Hae |
2013-10 | Thermodynamic stability of various phases of zinc tin oxides from ab initio calculations | Lee, Joohwi; Lee, Seung-Cheol; Hwang, Cheol Seong; Choi, Jung-Hae |
2012-05-15 | Threshold resistive and capacitive switching behavior in binary amorphous GeSe | Jeong, Doo Seok; Lim, Hyungkwang; Park, Goon-Ho; Hwang, Cheol Seong; Lee, Suyoun; Cheong, Byung-ki |
2013-02 | Titanium dioxide thin films for next-generation memory devices | Kim, Seong Keun; Kim, Kyung Min; Jeong, Doo Seok; Jeon, Woojin; Yoon, Kyung Jean; Hwang, Cheol Seong |
2019-03-07 | Tunneling Properties of the Charge Carriers through Sub-2-nm-Thick Oxide in Ge/a-GeO2/Ge Structures Using the First-Principles Scattering-State Method | Ko, Eunjung; Liu, Kai; Hwang, Cheol Seong; Choi, Hyoung Joon; Choi, Jung-Hae |