Showing results 5 to 6 of 6
Issue Date | Title | Author(s) |
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2019-03-07 | Tunneling Properties of the Charge Carriers through Sub-2-nm-Thick Oxide in Ge/a-GeO2/Ge Structures Using the First-Principles Scattering-State Method | Ko, Eunjung; Liu, Kai; Hwang, Cheol Seong; Choi, Hyoung Joon; Choi, Jung-Hae |
2013-07 | Tunneling properties versus electronic structures in Si/SiO2/Si junctions from first principles | Ko, Eunjung; Lee, Kwang-Ryeol; Choi, Hyoung Joon |