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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
1999-12-15Mechanism maps for electromigration-induced failure of metal and alloy interconnectsAndleigh, VK; Srikar, VT; Park, YJ; Thompson, CV
1999-04-01Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnectsPark, YJ; Andleigh, VK; Thompson, CV
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