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Issue Date | Title | Author(s) |
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2023-12 | Effects of Al2O3 Interfacial Layer Thickness for HZO/InGaAs Ferroelectric Capacitors With Superior Polarization and MOS Interface Properties | Ko, Kyul; Ahn, Daehwan; Suh, Hoyoung; Ju, Byeong-Kwon; Han, Jae Hoon |