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Issue DateTitleAuthor(s)
2020-05Comparison of quantitative analyses using SIMS, atom probe tomography, and femtosecond laser ablation inductively coupled plasma mass spectrometry with Si1-XGeX and Fe1-X Ni-X binary alloysJang, Yun Jung; Kim, Seon Hee; Kim, Kyung Joong; Kim, Donghwan; Lee, Yeonhee
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