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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
2014-10Quantitative analyses of photovoltaic CIGS thin films via SIMS depth profiling with elemental ions and MCs+ clustersLee, Jihye; Kim, Seon Hee; Lee, Yeonhee
2014-11Quantitative analysis for CIGS thin films by surface analytical techniquesKim, Seon Hee; Jang, Yun Jung; Yoon, Jung Hyeon; Jeong, Jeung-hyun; Lee, Yeonhee
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