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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
2014-06Improved quantitative analysis of Cu(In,Ga)Se-2 thin films using MCs+-SIMS depth profilingLee, Jihye; Kim, Seon Hee; Lee, Kang-Bong; Min, Byoung Koun; Lee, Yeonhee
2014-10Quantitative analyses of photovoltaic CIGS thin films via SIMS depth profiling with elemental ions and MCs plus clustersLee, Jihye; Kim, Seon Hee; Lee, Yeonhee
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