Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
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1996-09 | Determining the absolute value of penetration depth of large area films | Lee, J.Y.; Kim, Y.H.; Hahn, T.-S.; Choi, S.S. |
2016-08 | Measurement errors of the EIT systems using a phantom and conductive yarns | Park, J.S.; Koo, S.-M.; Kim, C.H. |