Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
---|---|---|
2004-02 | Ellipsometric spectroscopy study of Ar ion-beam mixed SiO2/Si/SiO2 layers | Kim, HB; Son, JH; Whang, CN; Chae, KH |
2000-10 | Light-emitting properties of Si-ion-irradiated SiO2/Si/SiO2 layers | Kim, HB; Son, JH; Whang, CN; Chae, KH; Lee, WS; Im, S; Kim, SO; Woo, JJ; Song, JH |