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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
2004-02Ellipsometric spectroscopy study of Ar ion-beam mixed SiO2/Si/SiO2 layersKim, HB; Son, JH; Whang, CN; Chae, KH
2000-10Light-emitting properties of Si-ion-irradiated SiO2/Si/SiO2 layersKim, HB; Son, JH; Whang, CN; Chae, KH; Lee, WS; Im, S; Kim, SO; Woo, JJ; Song, JH
1

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