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Issue DateTitleAuthor(s)
2004-01Physical and electrical properties of ultrathin HfO2/HfSixOy stacked gate dielectrics on compressively strained-Si0.74Ge0.26/Si heterolayersMaikap, S; Lee, JH; Kim, DY; Mahapatra, R; Ray, SK; Song, JH; No, YS; Choi, WK
1

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